Overview
μClamp®0841PQ designed to protect sensitive electronics from damage or latch-up due to EOS, lightning, CDE, and ESD. They feature large cross-sectional area junctions for conducting high transient currents. They offer desirable characteristics for board level protection, including fast response time, low operating and clamping voltage, and no device degradation. μClamp0841PQ is in a 2-pin DFN package. It measures 1.6 x 1.0mm with a nominal height of only 0.50mm. μClamp0841PQ is qualified to AEC-Q100 and AEC-Q101 for automotive use.
Features
- High ESD withstand Voltage:
- EC 61000-4-2 (ESD): 30kV (Contact), 30kV (Air)
- IEC 61000-4-4 (EFT): 40A (5/50ns)
- IEC 61000-4-5 (Lightning): 65A (8/20μs)
- Protects one I/O or power line
- High peak pulse current capability
- Low clamping voltageŸWorking voltage: 8.4V
- Low leakage current
- Solid-state silicon-avalanche technology
- Qualified to AEC-Q100, Grade 1 and AEC-Q101
Applications
- Automotive Applications
- USB Voltage Bus
- Battery Protection
- Digital Lines
- Proximity Sensors
Inventory
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